Beilstein J. Nanotechnol.2016,7, 1501–1506, doi:10.3762/bjnano.7.143
, Australia 10.3762/bjnano.7.143 Abstract Scanning electron microscopy transmissionKikuchidiffraction is able to identify twins in nanocrystalline material, regardless of their crystallographic orientation. In this study, it was employed to characterize deformation twins in Cu/10 wt % Zn processed by high
nanoscale twins thinner than its step size.
Keywords: nanocrystalline materials; transmissionKikuchidiffraction; triple junctions; twins; Introduction
The Hall–Petch relationship has inspired materials scientists to refine grains to increase the strength of materials since the early 1950s [1][2][3
electron microscope (SEM) to collect transmissionKikuchidiffraction (TKD) patterns from sub-10-nm domains in an electron transparent sample [28][30][31]. Like conventional EBSD, TKD can measure grain size, morphology, phase distribution and crystalline lattice orientation. However, the biggest advantage
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Figure 1:
A typical bright-field TEM image of the HPT Cu–Zn alloy showing severe deformation and grain refine...